XtaLight Technologies

OUR SOLUTION

Our DRM technology allows resolving the atomic lattice orientation of crystalline solids through the analysis of their anisotropic surface reflectance. Because DRM is entirely based on optical microscopy, it requires no vacuum and can be employed over large areas. These features enable fast, cost-effective, and previously impossible crystallographic measurements of the entire components.

Lower equipment investment cost Rapid characterization Large field-of-view

DATA-DRIVEN APPROACH

We rely on machine learning models to index crystallographic orientation from the anisotropic surface reflectance signals measured by DRM. After an initial calibration against electron back scatter diffraction, the models provide robust and reliable orientation predictions for a variety of different metal alloys, ceramics, and even composite materials.

NOT ONLY FOR METALS

The DRM map here was captured from an entire polycrystalline silicon wafer. It would be impossible to take an EBSD scan of such a large sample. DRM could also be used as an in-line characterization technique to inspect batches of entire parts in series.

PRODUCTS & SERVICES

Customized DRM Equipment

At XtaLight, we understand that every business has unique needs and requirements when it comes to microstructure characterization. Different materials, different sample size, parts with non-standard geometry, spatial resolution and measurement throughput, investment cost, etc.. Therefore, we offer customized solutions that cater to the specific needs of each customer, including custom-made equipment and software. Our experienced team of engineers and material scientists will work closely with you from the beginning to identify the most suitable solution.

Measurement Services

We also offer a comprehensive range of microstructure analysis services for materials that our current database supports. These measurements include surface analysis and finish quality, grain size and crystallographic orientation mapping, and more. Our services focus on analyzing these quantities over large-size components that are not fit to traditional electron-based characterization methods.

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Supported by

Nanyang Technological University Singapore